Complex diagnostic of CdTe after under-threshold laser irradiation by photoluminescence, photoconductivity, and electrophysical methods
Loading...
Date
1995-11-03
Authors
Kopishynska, O. P.
Babentsov, V. N.
Vlasenko, O. I.
Mozol', P. E.
Копішинська, Олена Петрівна
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
Description
Vladimir N. Babentsov, Aleksandr I. Vlasenko, Peter E. Mozol', Elena P. Kopishinskaya. Complex diagnostic of CdTe after under-threshold laser irradiation by photoluminescence, photoconductivity, and electrophysical methods // Proceedings SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995). 1995. P.370-377.
Keywords
Optoelectronics, semiconductors, Luminescence, Laser damage threshold, Excitons Raman scattering, Ruby lasers